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To illustrate Michaud's classic study
according to his formulation
Reprint of the The MIT Press
professor and administrator at the University of Connecticut for 40 years
Protection of Electronic Circuits from Overvoltages To illustrate Michaud's classic studyTemporary failure and permanent damage of electronic systems are often caused by electrical overstresses such as lightning, electromagnetic pulses from nuclear weapons, and switching of reactive loads. Protecting industrial, military, and consumer systems from failure is critical; and until the publication of this volume, the related literature was scattered throughout journals, patents, conference proceedings, military reports, and elsewhere. This
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